Experimental Characterization of Fault-Tolerant Circuits in Small-Scale Quantum Processors (2021)

First Author: Cane R

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/access.2021.3133483

Publication URI: http://dx.doi.org/10.1109/access.2021.3133483

Type: Journal Article/Review

Parent Publication: IEEE Access