Quantification of hard X-ray photoelectron spectroscopy: Calculating relative sensitivity factors for 1.5- to 10-keV photons in any instrument geometry (2022)
Attributed to:
Sir Henry Royce InsStitute - recurrent grant
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1002/sia.7059
Publication URI: http://dx.doi.org/10.1002/sia.7059
Type: Journal Article/Review
Parent Publication: Surface and Interface Analysis
Issue: 4