Quantification of hard X-ray photoelectron spectroscopy: Calculating relative sensitivity factors for 1.5- to 10-keV photons in any instrument geometry (2022)

First Author: Cant D
Attributed to:  Sir Henry Royce InsStitute - recurrent grant funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/sia.7059

Publication URI: http://dx.doi.org/10.1002/sia.7059

Type: Journal Article/Review

Parent Publication: Surface and Interface Analysis

Issue: 4