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Exploring high-frequency eddy-current testing for sub-aperture defect characterisation using parametric-manifold mapping (2021)

First Author: Hughes R

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.ndteint.2021.102534

Publication URI: http://dx.doi.org/10.1016/j.ndteint.2021.102534

Type: Journal Article/Review

Parent Publication: NDT & E International