Suppression of Hot-Carrier Effects Facilitated by the Multimodal Thin-Film Transistor Architecture (2021)

First Author: Bestelink E
Attributed to:  Design for high-yield manufacturing of printed circuits funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/aelm.202100533

Publication URI: http://dx.doi.org/10.1002/aelm.202100533

Type: Journal Article/Review

Parent Publication: Advanced Electronic Materials

Issue: 9