Monitoring Carbon in Electron and Ion Beam Deposition within FIB-SEM. (2021)
Attributed to:
SEE MORE: SECONDARY ELECTRON EMISSION - MICROSCOPY FOR ORGANICS WITH RELIABLE ENGINEERING-PROPERTIES
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.3390/ma14113034
PubMed Identifier: 34199625
Publication URI: http://europepmc.org/abstract/MED/34199625
Type: Journal Article/Review
Volume: 14
Parent Publication: Materials (Basel, Switzerland)
Issue: 11
ISSN: 1996-1944