Novel lockstep-based fault mitigation approach for SoCs with roll-back and roll-forward recovery (2021)

First Author: Kasap S

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.microrel.2021.114297

Publication URI: http://dx.doi.org/10.1016/j.microrel.2021.114297

Type: Journal Article/Review

Parent Publication: Microelectronics Reliability