True-to-size surface mapping with neutral helium atoms (2021)
Attributed to:
Microscopy with neutral helium atoms: A wide-ranging new technique for delicate samples
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1103/physreva.103.053315
Publication URI: http://dx.doi.org/10.1103/physreva.103.053315
Type: Journal Article/Review
Parent Publication: Physical Review A
Issue: 5