Fatigue crack evolution and effect analysis of Ag sintering die-attachment in SiC power devices under power cycling based on phase-field simulation (2021)
Attributed to:
Underpinning Power Electronics 2017: Heterogeneous Integration
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.microrel.2021.114244
Publication URI: http://dx.doi.org/10.1016/j.microrel.2021.114244
Type: Journal Article/Review
Parent Publication: Microelectronics Reliability