X-ray characterisation of the basal stacking fault densities of (112¯2) GaN (2021)

First Author: Pristovsek M

Attributed to: Lighting the Future funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1039/d1ce00627d

Publication URI: http://dx.doi.org/10.1039/d1ce00627d

Type: Journal Article/Review

Parent Publication: CrystEngComm

Issue: 35