A closed-loop feature-based FTS patterning and characterisation of functional structured surfaces (2021)

First Author: Tong Z

Attributed to: Future Advanced Metrology Hub funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/2051-672x/abedf8

Publication URI: http://dx.doi.org/10.1088/2051-672x/abedf8

Type: Journal Article/Review

Parent Publication: Surface Topography: Metrology and Properties

Issue: 2