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Monitoring dynamics of defects and single Fe atoms in N-functionalized few-layer graphene by in situ temperature programmed scanning transmission electron microscopy (2022)

First Author: Arrigo R

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.jechem.2021.05.005

Publication URI: http://dx.doi.org/10.1016/j.jechem.2021.05.005

Type: Journal Article/Review

Parent Publication: Journal of Energy Chemistry