Electric field mapping of wide-bandgap semiconductor devices at a submicrometre resolution (2021)

First Author: Cao Y
Attributed to:  Sub-micron 3-D Electric Field Mapping in GaN Electronic Devices funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1038/s41928-021-00599-5

Publication URI: http://dx.doi.org/10.1038/s41928-021-00599-5

Type: Journal Article/Review

Parent Publication: Nature Electronics

Issue: 7