Argon cluster-ion sputter yield: Molecular dynamics simulations on silicon and equation for estimating total sputter yield (2021)
Attributed to:
University of Newcastle - Equipment Account
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1002/sia.6996
Publication URI: http://dx.doi.org/10.1002/sia.6996
Type: Journal Article/Review
Parent Publication: Surface and Interface Analysis
Issue: 4