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Scanning thermal microscopy for accurate nanoscale device thermography (2021)

First Author: Gucmann F

Attributed to: Integrated GaN-Diamond Microwave Electronics: From Materials, Transistors to MMICs funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.nantod.2021.101206

Publication URI: http://dx.doi.org/10.1016/j.nantod.2021.101206

Type: Journal Article/Review

Parent Publication: Nano Today