Scanning thermal microscopy for accurate nanoscale device thermography (2021)

First Author: Gucmann F
Attributed to:  Quantitative non-destructive nanoscale characterisation of advanced materials funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.nantod.2021.101206

Publication URI: http://dx.doi.org/10.1016/j.nantod.2021.101206

Type: Journal Article/Review

Parent Publication: Nano Today