A fast simulation method for analysis of SEE in VLSI (2021)
Attributed to:
Robust remote sensing for multi-modal characterisation in nuclear and other extreme environments
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.microrel.2021.114110
Publication URI: http://dx.doi.org/10.1016/j.microrel.2021.114110
Type: Journal Article/Review
Parent Publication: Microelectronics Reliability