A fast simulation method for analysis of SEE in VLSI (2021)

First Author: Lu Y

Attributed to: National Centre for Nuclear Robotics (NCNR) funded by ISCF

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.microrel.2021.114110

Publication URI: http://dx.doi.org/10.1016/j.microrel.2021.114110

Type: Journal Article/Review

Parent Publication: Microelectronics Reliability