Impact of carbon in the buffer on power switching GaN-on-Si and RF GaN-on-SiC HEMTs (2021)
Attributed to:
Sub-micron 3-D Electric Field Mapping in GaN Electronic Devices
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.35848/1347-4065/abdb82
Publication URI: http://dx.doi.org/10.35848/1347-4065/abdb82
Type: Journal Article/Review
Parent Publication: Japanese Journal of Applied Physics
Issue: SB