Quantification of Trace-Level Silicon Doping in Al x Ga1-xN Films Using Wavelength-Dispersive X-Ray Microanalysis. (2021)

First Author: Spasevski L

Attributed to: University of Strathclyde - Equipment Account" funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1017/s1431927621000568

PubMed Identifier: 34218838

Publication URI: http://europepmc.org/abstract/MED/34218838

Type: Journal Article/Review

Volume: 27

Parent Publication: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

Issue: 4

ISSN: 1431-9276