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Kinetic Monte Carlo Analysis of the Operation and Reliability of Oxide Based RRAMs

First Author: Sadi T

Attributed to: Resistive switches (RRAM) and memristive behaviour in silicon-rich silicon oxides funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1007/978-3-030-41032-2_49

Publication URI: http://dx.doi.org/10.1007/978-3-030-41032-2_49

Type: Book Chapter

Book Title: Large-Scale Scientific Computing - 12th International Conference, LSSC 2019, Sozopol, Bulgaria, June 10-14, 2019, Revised Selected Papers (2020)

Page Reference: 429-437

ISSN: 1573-3149