Kinetic Monte Carlo Analysis of the Operation and Reliability of Oxide Based RRAMs
Attributed to:
Resistive switches (RRAM) and memristive behaviour in silicon-rich silicon oxides
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1007/978-3-030-41032-2_49
Publication URI: http://dx.doi.org/10.1007/978-3-030-41032-2_49
Type: Book Chapter
Book Title: Large-Scale Scientific Computing - 12th International Conference, LSSC 2019, Sozopol, Bulgaria, June 10-14, 2019, Revised Selected Papers (2020)
Page Reference: 429-437
ISSN: 1573-3149