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Atom Probe Tomography of a Cu-Doped TiNiSn Thermoelectric Material: Nanoscale Structure and Optimization of Analysis Conditions. (2021)

First Author: He H

Attributed to: A Focused Ion Beam Microscopy Facility for Advanced Materials Analysis funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1017/s1431927621012162

PubMed Identifier: 34315548

Publication URI: http://europepmc.org/abstract/MED/34315548

Type: Journal Article/Review

Parent Publication: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

ISSN: 1431-9276