Atom Probe Tomography of a Cu-Doped TiNiSn Thermoelectric Material: Nanoscale Structure and Optimization of Analysis Conditions. (2021)
Attributed to:
A Focused Ion Beam Microscopy Facility for Advanced Materials Analysis
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1017/s1431927621012162
PubMed Identifier: 34315548
Publication URI: http://europepmc.org/abstract/MED/34315548
Type: Journal Article/Review
Parent Publication: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
ISSN: 1431-9276