Inelastic background modelling applied to Hard X-ray Photoelectron Spectroscopy of deeply buried layers: a comparison of synchrotron and lab-based (9.25 keV) measurements (2021)
Attributed to:
Sir Henry Royce InsStitute - recurrent grant
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Type: Journal Article/Review
Parent Publication: Applied Surface Science