Inelastic background modelling applied to Hard X-ray Photoelectron Spectroscopy of deeply buried layers: a comparison of synchrotron and lab-based (9.25 keV) measurements (2021)

First Author: Spencer B
Attributed to:  Sir Henry Royce InsStitute - recurrent grant funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Type: Journal Article/Review

Parent Publication: Applied Surface Science