Segmentation phase measuring deflectometry for measuring structured specular surfaces (2021)

First Author: Xu Y
Attributed to:  Future Advanced Metrology Hub funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1007/s00170-021-08439-8

Publication URI: http://dx.doi.org/10.1007/s00170-021-08439-8

Type: Journal Article/Review

Parent Publication: The International Journal of Advanced Manufacturing Technology

Issue: 3-4