Formation of a ternary oxide barrier layer and its role in switching characteristic of ZnO-based conductive bridge random access memory devices (2022)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/5.0076903
Publication URI: http://dx.doi.org/10.1063/5.0076903
Type: Journal Article/Review
Parent Publication: APL Materials
Issue: 3