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A study of the silicon divacancy defect in the E2V LSST CCD250 using the single trap pumping method (2020)

First Author: Wood D

Attributed to: UK Involvement in LSST: Phase B (Oxford component) funded by STFC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1117/12.2561561

Publication URI: http://dx.doi.org/10.1117/12.2561561

Type: Conference/Paper/Proceeding/Abstract