A study of the silicon divacancy defect in the E2V LSST CCD250 using the single trap pumping method (2020)

First Author: Wood D
Attributed to:  UK Involvement in LSST: Phase B (Oxford component) funded by STFC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1117/12.2561561

Publication URI: http://dx.doi.org/10.1117/12.2561561

Type: Conference/Paper/Proceeding/Abstract