Error-Constraint Deep Learning Scheme for Electrical Impedance Tomography (EIT) (2022)

First Author: Wang Q

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tim.2021.3135327

Publication URI: http://dx.doi.org/10.1109/tim.2021.3135327

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Instrumentation and Measurement