V-Net Deep Imaging Method for Electrical Resistance Tomography (2020)

First Author: Li F

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/jsen.2020.2973337

Publication URI: http://dx.doi.org/10.1109/jsen.2020.2973337

Type: Journal Article/Review

Parent Publication: IEEE Sensors Journal

Issue: 12