Bipolar Degradation monitoring of 4H-SiC MOSFET Power Devices by Electroluminescence Measurements (2021)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/iecon48115.2021.9589563
Publication URI: http://dx.doi.org/10.1109/iecon48115.2021.9589563
Type: Conference/Paper/Proceeding/Abstract