Reliability Study of MOS Capacitors Fabricated on 3C-SiC/Si Substrates (2020)

First Author: Li F
Attributed to:  Underpinning Power Electronics 2012: Devices Theme funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.4028/www.scientific.net/msf.1004.659

Publication URI: http://dx.doi.org/10.4028/www.scientific.net/msf.1004.659

Type: Journal Article/Review

Parent Publication: Materials Science Forum