Photoassisted ionization spectroscopy of few implanted bismuth orbitals in a silicon-on-insulator device (2022)

First Author: Stockbridge K

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/5.0079560

Publication URI: http://dx.doi.org/10.1063/5.0079560

Type: Journal Article/Review

Parent Publication: Applied Physics Letters

Issue: 7