Xenon plasma focussed ion beam preparation of an Al-6XXX alloy sample for atom probe tomography including analysis of an a-Al(Fe,Mn)Si dispersoid (2021)
Attributed to:
A LEAP 5000 XS for the UK National Atom Probe Facility
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.matchar.2021.111194
Publication URI: http://dx.doi.org/10.1016/j.matchar.2021.111194
Type: Journal Article/Review
Parent Publication: Materials Characterization
ISSN: 1044-5803