Xenon plasma focussed ion beam preparation of an Al-6XXX alloy sample for atom probe tomography including analysis of an a-Al(Fe,Mn)Si dispersoid (2021)

First Author: Famelton J
Attributed to:  A LEAP 5000 XS for the UK National Atom Probe Facility funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.matchar.2021.111194

Publication URI: http://dx.doi.org/10.1016/j.matchar.2021.111194

Type: Journal Article/Review

Parent Publication: Materials Characterization

ISSN: 1044-5803