A deep learning based automatic defect analysis framework for In-situ TEM ion irradiations (2021)

First Author: Shen M

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.commatsci.2021.110560

Publication URI: http://dx.doi.org/10.1016/j.commatsci.2021.110560

Type: Journal Article/Review

Parent Publication: Computational Materials Science