Modeling of Bipolar Degradations in 4H-SiC Power MOSFET Devices by a 3C-SiC Inclusive Layer Consideration in the Drift Region (2022)

Abstract

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Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tpel.2021.3112384

Publication URI: http://dx.doi.org/10.1109/tpel.2021.3112384

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Power Electronics

Issue: 3