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The effect of work function during electron spectroscopy measurements in Scanning Field-Emission Microscopy. (2022)

First Author: Bodik M

Attributed to: SEE MORE MAKE MORE: Secondary Electron Energy Measurement Optimised for Reliable Manufacture of Key Materials: Opportunity, Realisation, Exploitation funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.ultramic.2022.113547

PubMed Identifier: 35545000

Publication URI: http://europepmc.org/abstract/MED/35545000

Type: Journal Article/Review

Volume: 238

Parent Publication: Ultramicroscopy

ISSN: 0304-3991