Xenon Ion Implantation Induced Surface Compressive Stress for Preventing Dendrite Penetration in Solid-State Electrolytes. (2022)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/smll.202108124

PubMed Identifier: 35434905

Publication URI: http://europepmc.org/abstract/MED/35434905

Type: Journal Article/Review

Volume: 18

Parent Publication: Small (Weinheim an der Bergstrasse, Germany)

Issue: 23

ISSN: 1613-6810