Dielectric breakdown in HfO2 dielectrics: Using multiscale modeling to identify the critical physical processes involved in oxide degradation (2022)
Attributed to:
Structural dynamics of amorphous functional oxides - the role of morphology and electrical stress
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/5.0083189
Publication URI: http://dx.doi.org/10.1063/5.0083189
Type: Journal Article/Review
Parent Publication: Journal of Applied Physics
Issue: 23