📣 Try out the NEW Gateway to Research and let us know what you think.

We're looking for users to test the new service during August and September and share their feedback. Express your interest by completing this short form.

Edge termination in vertical GaN diodes: Electric field distribution probed by second harmonic generation (2022)

First Author: Cao Y

Attributed to: Sub-micron 3-D Electric Field Mapping in GaN Electronic Devices funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/5.0096755

Publication URI: http://dx.doi.org/10.1063/5.0096755

Type: Journal Article/Review

Parent Publication: Applied Physics Letters

Issue: 24