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AC RTN: Testing, Modeling, and Prediction (2022)

First Author: Tok K

Attributed to: Variability-aware RRAM PDK for design based research on FPGA/neuro computing funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ted.2022.3195690

Publication URI: http://dx.doi.org/10.1109/ted.2022.3195690

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Electron Devices

Issue: 10