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The effect of facet lines on critical current density and trapped field in bulk RE-Ba-Cu-O single grains (2022)

First Author: Shi Y

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1361-6668/ac883d

Publication URI: http://dx.doi.org/10.1088/1361-6668/ac883d

Type: Journal Article/Review

Parent Publication: Superconductor Science and Technology

Issue: 10