Detection of Yield Point Behavior by Acoustic Emission in thin Films (2015)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.matpr.2015.07.341
Publication URI: http://dx.doi.org/10.1016/j.matpr.2015.07.341
Type: Journal Article/Review
Parent Publication: Materials Today: Proceedings