Precision metrology: from bulk optics towards metasurface optics (2022)

First Author: Jiang X
Attributed to:  Next Generation Metrology Driven by Nanophotonics funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1080/00107514.2022.2101745

Publication URI: http://dx.doi.org/10.1080/00107514.2022.2101745

Type: Journal Article/Review

Parent Publication: Contemporary Physics

Issue: 4