Impact of the Figures of Merit (FoMs) Definitions on the Variability in Nanowire TFET: NEGF Simulation Study (2022)

First Author: Guan Y
Attributed to:  Quantum Electronics Device Modelling (QUANTDEVMOD) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ted.2022.3204596

Publication URI: http://dx.doi.org/10.1109/ted.2022.3204596

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Electron Devices

Issue: 11