A Correlative Study of Interfacial Segregation in a Cu-Doped TiNiSn Thermoelectric half-Heusler Alloy. (2022)
Attributed to:
A Focused Ion Beam Microscopy Facility for Advanced Materials Analysis
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1021/acsaelm.2c00699
PubMed Identifier: 36185076
Publication URI: http://europepmc.org/abstract/MED/36185076
Type: Journal Article/Review
Volume: 4
Parent Publication: ACS applied electronic materials
Issue: 9
ISSN: 2637-6113