AC RTN: Testing, Modeling, and Prediction (2022)
Attributed to:
Realistic fault modelling to enable optimization of low power IoT and Cognitive fault-tolerant computing systems
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/ted.2022.3195690
Publication URI: http://dx.doi.org/10.1109/ted.2022.3195690
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Electron Devices
Issue: 10