In-situ sputtering from the micromanipulator to enable cryogenic preparation of specimens for atom probe tomography by focused-ion beam (2022)
Attributed to:
Nanoscale Advanced Materials Engineering
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Publication URI: https://arxiv.org/abs/2211.06877
Type: Journal Article/Review
Parent Publication: Pre-print Arxiv