Putting High-Index Cu on the Map for High-Yield, Dry-Transferred CVD Graphene. (2023)
Attributed to:
Expanding the Environmental Frontiers of Operando Metrology for Advanced Device Materials Development
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1021/acsnano.2c09253
PubMed Identifier: 36594782
Publication URI: http://europepmc.org/abstract/MED/36594782
Type: Journal Article/Review
Volume: 17
Parent Publication: ACS nano
Issue: 2
ISSN: 1936-0851