Improving the technological readiness of time of Flight-Secondary Ion Mass Spectrometry for enhancing fingermark recovery - towards operational deployment (2023)
Attributed to:
Ion Beam Analysis for the 2020's and Beyond: An Integration of Elemental Mapping and 'omics'
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.scijus.2022.10.004
PubMed Identifier: 36631186
Publication URI: http://europepmc.org/abstract/MED/36631186
Type: Journal Article/Review
Parent Publication: Science & Justice
Issue: 1
ISSN: 1355-0306